Afternoon 1: Mixed-Signal DfT and BIST: Trends, Challenges and Solutions
- Introduction
- Trends in analog testing and DfT
- Trends in analog DfT standards
- Trends in analog BIST
- Essential principles of practical analog BIST
- Road to practical solutions
- Conclusions
Afternoon 2: Analog Defect Modelling and Measuring Defect Coverage
- Introduction
- Analog defects
- Analog defect injection for simulation
- Defect weighting
- Defect simulation
- Estimating DPPM
- Diagnosing undetected defects to improve coverage
- Measuring ISO 26262 metrics
- Conclusions
Afternoon 3: Systematic Analog DfT and Test Generation
- Introduction
- Systematic DfT strategies
- Overview of IEEE 1687 and P1687.2
- IEEE P1687.2 Instrument Connectivity Language (ICL) to describe test access
- IEEE P1687.2 Procedural Description Language (PDL) to describe mixed-signal tests
- From block-level to IC-level, to ATE
- Conclusions
Afternoon 4: Analog IJTAG Practical Example, and iStream, Q&A
- Analog IJTAG Practical Example, and iStream
- Instructor presents answers to any questions during course that could not be answered immediately
- General Q&A about course content
- Discussion on attendee-submitted A/MS test and DfT problems and challenges