Stephen Sunter has been an Engineering Director for Mixed-Signal DFT for the last 25 years, at LogicVision, then Mentor, and now Siemens EDA. Prior to that, he was Manager of Mixed-Signal Test Engineering, Manager of Cell Library Development, and a Mixed-Signal IC Designer, all at Nortel, starting in 1977.
He has been presenting the longest running tutorial at the International Test Conference (ITC), “Mixed-Signal DfT & BIST: Trends, Principles, and Solutions” in full-day and then half-day formats since 1999, continually updating the content to track the latest developments.
He has presented/published approximately 70 papers, 7 engineering magazine articles, and 4 book chapters on the topic. Four of his papers received awards at ITC, the most for any primary author.
He has been a member of every IEEE Standard Working Group that addresses mixed-signal DFT (1149.4, .6, .8, .10), and presently chairs the P2427 and P1687.2 Working Groups. He is, or has been, a long-serving member of most IEEE test-related conference Program Committees, including ITC, VTS, ETS, IMSTW, DATE, and TVHSAC, and is a Life Senior Member of IEEE.
In 2024 he received the prestigious Bob Madge Innovation award at the International Test Conference, San Diego. This award recognizes “innovation that matters” in semiconductor design, test and data analysis. An expert in his field, Steve was instrumental in providing the first commercially successful analog defect simulator.
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