Day part 1: Mixed-Signal DfT & BIST: Trends, Principles, and Solutions
· Introduction
· Trends in analog testing and DfT
· Trends in analog DfT standards
· Trends in analog BIST
· Essential principles of practical analog BIST
· Road to practical solutions
· Conclusions
Day part 2: Analog Defect Modeling and Measuring Defect Coverage
· Introduction
· Analog defects
· Analog defect injection for simulation
· Defect weighting
· Defect simulation
· Estimating DPPM
· Diagnosing undetected defects to improve coverage
· Measuring ISO 26262 metrics
· Conclusions
Day part 3: Systematic Analog DfT and Test Generation
· Introduction
· Systematic DfT strategies
· Overview of IEEE 1687 and P1687.2
· IEEE P1687.2 Instrument Connectivity Language (ICL) to describe test access
· IEEE P1687.2 Procedural Description Language (PDL) to describe mixed-signal tests
· From block-level to IC-level, to ATE
· Conclusions
Day part 4: Lessons, Q&A and discussions on (company specific) DfT problems and solutions
· Topics left over from the first 3 dayparts
· Instructor presents answers to any questions during course that could not be answered immediately
· Attendees introduce (company-specific) A/MS test and DfT challenges, for instructor-guided discussions
· General Q&A about course content